Products / PHASEYE

PHASEYE FMC-64

Real-time FMC, TFM and 3D imaging for advanced phased array ultrasonic inspection.

The Eintik PHASEYE FMC-64 is a 64:128 PR full-matrix phased array flaw detector that integrates FMC, real-time TFM, conventional PAUT, PCI, PWI, TOFD and three-dimensional visualization in one field-ready platform.

64:128 PRPA / UT transmit-receive configuration
2 GB/sFMC data acquisition speed
8192Maximum focal laws
11.6 inFull HD capacitive touchscreen

PHASEYE FMC-64 Product Videos

High-resolution TFM, weld inspection and full-focusing applications.

Six English-language demonstrations show the core PHASEYE FMC-64 capabilities. Every video uses permanently embedded English technical captions.

64:128PR / TFM

PHASEYE FMC-64: 64:128PR Large-Aperture High-Resolution TFM Scanning

Large-aperture acquisition and high-resolution total focusing for demanding inspections.

Multi-Group TFM

PHASEYE: Simultaneous Multi-Group, Multi-Mode TFM Scanning

Multiple groups and propagation modes displayed in one coordinated inspection workflow.

Weld Inspection

PHASEYE: Simultaneous Real-Time PAUT and TFM Weld Inspection

Real-time conventional phased array and TFM imaging for weld examination.

Full Focusing

PHASEYE FMC-64 Full-Focusing PAUT Capabilities

An overview of total focusing, image clarity and advanced phased array inspection performance.

Castings & Forgings

PHASEYE Full-Focusing Inspection of Castings and Forgings

TFM inspection performance on industrial cast and forged components.

Product Overview

PHASEYE Full-Focusing PAUT Flaw Detector: Features and Applications

Key instrument functions, imaging modes and representative industrial applications.

Product Overview

Built for demanding inspection work.

The compact instrument uses aerospace-derived thermal materials and a reinforced aluminum-alloy housing for durability, heat management and effective electromagnetic shielding. Its bright, wide-format industrial capacitive screen supports clear operation indoors and outdoors.

Up to two high-capacity hot-swappable lithium batteries support a normal field shift, with operating time dependent on channel configuration, screen brightness and processing load. The multi-axis encoder interface supports encoded scanning and precise data positioning.

PHASEYE combines the instrument, probes, wedges, encoders, scanners and application software as one coordinated inspection ecosystem. This makes it suitable for standard field inspections as well as specialized industrial ultrasonic application development.

  • FMC, TFM and conventional PAUT available in one platform
  • PAUT and TFM scanning can be displayed simultaneously
  • Real-time 3D workpiece and sound-field visualization
  • Up to 128 elements for full-matrix acquisition
  • Three-axis scanning tools with real-time coverage display
  • 256 GB SSD storage, expandable to 1 TB
  • USB 3.0, Gigabit Ethernet, wireless, Bluetooth and Mini DisplayPort connectivity

Applications

One platform, broad inspection coverage.

The PHASEYE FMC-64 is designed for welds, bonded structures, composites and complex components across energy, transport and advanced manufacturing.

Water-cooled platesInspection of internal channels, bonds and manufacturing discontinuities.
Wind turbine bladesBlade and fiberglass inspection for bonding and laminate defects.
Pultruded platesHigh-resolution inspection of pultruded composite structures.
Composite materialsCarbon-fiber and other composite inspection, including coarse or attenuative structures.
HDPE pipeElectrofusion and welded-joint inspection for polyethylene piping.
Honeycomb bondingAluminum plate, aircraft skin and honeycomb bond inspection.
Bolts and gearsInspection of high-stress fasteners, gears and precision components.
New-energy batteriesInspection support for battery assemblies and advanced energy products.
Rail wheels and axlesDetection workflows for train wheels, axles and transport components.

PHASEYESOFT

Fast, efficient, real-time imaging.

PHASEYESOFT provides acquisition, processing, visualization and reporting in one workflow. A-, B-, C-, D- and S-scans can be combined with 3D data views so inspection results correspond more directly to the real component geometry.

FMC / TFM

Full-matrix acquisition and total focusing

Acquire up to 128 elements at speeds up to 2 GB/s, then generate high-resolution TFM images in real time with multiple propagation modes.

TOFD

Diffraction-based flaw sizing

Two conventional UT channel pairs support TOFD imaging and flaw-height measurement using diffraction time. PAUT and TOFD can be combined to use the strengths of both techniques.

PWI

Plane-wave imaging

Plane-wave excitation can increase TFM inspection efficiency and penetration, helping the instrument meet a wider range of application requirements.

PCI

Phase coherence imaging

After FMC acquisition, PCI forms images from signal phase coherence to improve defect sensitivity and support inspection of coarse-grained materials.

FLC / 3D

Built-in focal-law calculator

A proprietary focal-law calculator directly simulates the three-dimensional sound-field distribution before or during setup.

Integrated System

Instrument, probe and scanner matching

Eintik's probe-development capability is integrated with the instrument platform, from specialist software and custom probes to encoders and scanning frames.

System Architecture

Designed to keep advanced imaging responsive.

The internal architecture prioritizes transfer bandwidth, dynamic range, low signal loss and parallel processing for real-time total focusing.

High-bandwidth DDR processingUp to 300 Gb of DDR bandwidth is referenced in the manufacturer's product material for smooth real-time TFM operation.
100 MSPS / 16-bit ADC architectureHigh dynamic range helps preserve fine inspection detail; the instrument specification lists digitization rates up to 200 MHz.
Low-loss transmit and receive circuitsProprietary circuit design reduces transmission and reception losses to support a high signal-to-noise ratio.
3D focal-law simulationThe built-in proprietary calculator models sound-field distribution for setup validation and complex applications.
High-voltage pulsingPA pulsing up to +/-100 V and conventional UT excitation up to 300 V support both precision components and larger workpieces.
64 / 128 synchronized hardware channelsSupports matrix-array, dual-matrix-array and other complex probe configurations.
FMC acquisition up to 2 GB/sHigh acquisition throughput improves data coverage and supports efficient full-matrix workflows.
Parallel instrument operationMultiple instruments can be connected for large-scale inspection systems and integrated applications.

Technical Specifications

PHASEYE series details.

Available hardware configurations cover 32- and 64-channel PA apertures with up to 128 receive channels. Final performance depends on configuration, probe, wedge, scanner and inspection setup.

Hardware configurations

ConfigurationMaximum PRFPA bandwidthMaximum PA apertureMaximum TFM aperture
64:128 PR40 kHz0.4-25 MHz64128
32:128 PR20 kHz, upgradeable to 40 kHz0.4-18 MHz3264
32:64 PR20 kHz, upgradeable to 40 kHz0.4-18 MHz3264

General instrument specifications

Dimensions348 x 254 x 114 mm
WeightApproximately 4.96 kg including one battery
Display11.6-inch, 1920 x 1080 full-HD industrial capacitive touchscreen
Operating temperature-10 to 45 degrees C
Storage temperature-10 to 60 degrees C with battery
CoolingTwo internal fans
HumidityUp to 70% at 45 degrees C, non-condensing
BatteryUp to two hot-swappable lithium batteries; approximately 5 hours with two batteries under typical configuration
Storage256 GB SSD, expandable to 1 TB
ConnectionsTwo USB 3.0 ports, Gigabit Ethernet, Mini DisplayPort and PA channel connectors
WirelessWireless networking, Bluetooth and remote-control support

Software and imaging

OperationResponsive multi-group acquisition and processing
DatabasesBuilt-in probe and wedge databases
Focusing setupFocus by depth, sound path or horizontal position
Focal-law tools2D focal-law calculation, beam coverage display and proprietary 3D sound-field simulation
3D visualization3D workpiece structure display and 3D inspection-data view
Simultaneous inspectionPAUT and TFM displayed at the same time
TFM workflowMulti-mode TFM simultaneous detection
Remote accessWireless remote control
Display modesA-scan, B-scan, C-scan, D-scan, S-scan, TOFD side view and 3D imaging

Phased array specifications

Probe / group capacityUp to four PA probes or 128 conventional UT channels; up to 128 groups
Resolution16-bit acquisition
A-scan amplitudeUp to 1600%
Data pointsUp to 16,384 points
Focal lawsUp to 8,192
Digitization rateUp to 200 MHz
PA pulse voltageUp to +/-100 V
Pulse typeNegative, positive or bipolar square wave
Gain range0-120 dB
Pulse width20-1,250 ns
Real-time averagingUp to 64
TCGMulti-point time-corrected gain

FMC, TFM, PCI and PWI

TFM propagation modesLL, LLL, LLLL, TT, TTT, TTTT, TTTTT, TLT, TLL and LTT
Maximum TFM image1024 x 1024 pixels
TFM data resolution16 bit
Real-time envelopeSupported
FMC / PCIFull-matrix acquisition with phase coherence imaging
PWI / TFMPlane-wave imaging with total focusing
FMC throughputUp to 2 GB/s

Conventional UT and TOFD

Conventional modesPulse-echo UT and TOFD
TOFD groupsTwo conventional UT channel pairs / two TOFD groups
Excitation voltageUp to 300 V, adjustable in 1 V steps
Pulse typeNegative square wave
Pulse width20-1,250 ns, adjustable in 1 ns steps
Maximum PRF30 kHz
Bandwidth0.4-25 MHz
Gain range0-120 dB
ViewsA-scan, TOFD side view and C-scan
PHASEYE FMC-64 used for ultrasonic inspection

System Matching

Configured around the inspection task.

TRX supplies PHASEYE instruments with matched phased array, conventional UT and TOFD probes; application-specific wedges; encoders; scanners; cables; transport protection; and technical configuration support.

Final channel configuration, probe aperture, wedge, encoder and accessories should be selected against the component geometry, inspection procedure, required imaging mode and applicable standard.

View the PHASEYE range

Middle East Support

Discuss your PHASEYE application with TRX.

Share the component, material, inspection procedure and required coverage so we can help configure the instrument, probes, wedges and scanner.